MFS-630 Thin Film Analayzer

The MFS-630 system comes standard with a miniature CCD spectrometer, reflection probe, manual X,Y stage, light source, lens assemblies and FilmSmart software. The MFS-630 can measure thickness, refractive index, exinction coeffecient, transmittance and reflectanceand quickly and easily. Spectral analysis of reflections from the top and bottom interfaces of the thin-film provides thickness and optical constants (n and k) in seconds. The entire desktop system sets up in minutes and can be used by anyone with basic computer skills.


System Components:

A brochure and operation manual are available for download.