Transometer - Thermal properties analysis of thin films


Simultaneously measures the thermoconductivity of thin films and the thermal interface resistance between them

Able to measure thickness of opaque materials (thin film metals or semiconductor layers)

Single measurement based on hundreds of laser shots takes less than a minute and has remarkable accuracy

Lasers power delivered via fiber


Semiconductor: metals, oxides, nitrides, low and high-k materials

FPD: LCD, PLED, and OLED materials

III-V compounds, opto-electronic materials

Hard and wear resistant coatings and other industrial coatings

MEMS and MOEMS thin film materials

Contract service testing is available. Please contact us for details and rates.
A brochure is available for download.